The Power Devices Electrical Characterization Laboratory covers the main needs of the Power Devices and Systems research group of IMB-CNM in terms of electrical assessment of the power devices developed in the Clean Room. In addition, it is also open for industrial and/or academic collaborations such as the characterization of commercial devices under specific conditions not provided in datasheets.

Main activities

The main activities performed in the Power Devices Electrical Characterization Laboratory are:

• Electrical validation of new power devices developed in the Clean Room.
• Electrical analysis of commercial power devices.
• Development of new techniques for electrical characterization.
• Development of integrated power systems.


• Steady-state electrical characterization of power devices at different temperatures:
   o Voltage-Current curves (forward and blocking)
   o Electrical parameters extraction (on-resistance, threshold voltage, etc.).
   o Capacitance-Voltage curves
   o Calibration of temperature sensitive parameters (up to 400ºC)
   o On-wafer mapping with semi-automatic probe stations
• Dynamic electrical characterization of power devices at different temperatures:
   o Switching tests and dynamic parameters extraction (turn-on and turn-off times, switching losses, etc.).
• Reliability/ruggedness testing of power devices:
   o Surge current test
   o Power cycling
   o Short-circuit capability
• Integrated power systems development:
   o Assembly of integrated power systems (power modules).
   o Optical inspection of integrated power systems (metallization analysis, etc.).
• Development of specific measurement systems (switching boards, etc.).
• Development and production of probe cards for automatic on-wafer mapping of power devices.



• Static characterization of power devices:
   o Semiautomatic wafer probers with hot chuck (300ºC)
   o Source-measurement units (up to 15kV and 10A)
   o CV measurement equipment
   o Curve tracers (up to 3300 V – 400 A)
   o Instrumentation controllers (GPIB bus)
• Dynamic characterization of components:
   o Switching times
   o Power switching losses
   o Short-circuit characterization
   o Gate driving characteristics)
   o Parasitic capacitances extraction (up to 800 V)
• Surge and ESD characterization equipment
• Equipment for the design, development and characterization of power systems

Contact person of Power Devices Characterization Laboratory:
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