FACILITIES
POWER DEVICES CHARACTERIZATION LABORATORY
The Power Devices Electrical Characterization Laboratory covers the main needs of the Power Devices and Systems research group of IMB-CNM in terms of electrical assessment of the power devices developed in the Clean Room. In addition, it is also open for industrial and/or academic collaborations such as the characterization of commercial devices under specific conditions not provided in datasheets.
Main activities
The main activities performed in the Power Devices Electrical Characterization Laboratory are:
• Electrical validation of new power devices developed in the Clean Room.
• Electrical analysis of commercial power devices.
• Development of new techniques for electrical characterization.
• Development of integrated power systems.
Techniques
• Steady-state electrical characterization of power devices at different temperatures:
– Voltage-Current curves (forward and blocking)
– Electrical parameters extraction (on-resistance, threshold voltage, etc.).
– Capacitance-Voltage curves
– Calibration of temperature sensitive parameters (up to 400ºC)
– On-wafer mapping with semi-automatic probe stations
• Dynamic electrical characterization of power devices at different temperatures:
– Switching tests and dynamic parameters extraction (turn-on and turn-off times, switching losses, etc.).
• Reliability/ruggedness testing of power devices:
– Surge current test
– Power cycling
– Short-circuit capability
• Integrated power systems development:
– Assembly of integrated power systems (power modules).
– Optical inspection of integrated power systems (metallization analysis, etc.).
• Development of specific measurement systems (switching boards, etc.).
• Development and production of probe cards for automatic on-wafer mapping of power devices.
Equipment
• Static characterization of power devices:
– Semiautomatic wafer probers with hot chuck (300ºC)
– Source-measurement units (up to 15kV and 10A)
– CV measurement equipment
– Curve tracers (up to 3300 V – 400 A)
– Instrumentation controllers (GPIB bus)
• Dynamic characterization of components:
– Switching times
– Power switching losses
– Short-circuit characterization
– Gate driving characteristics)
– Parasitic capacitances extraction (up to 800 V)
• Surge and ESD characterization equipment
• Equipment for the design, development and characterization of power systems
Contact person of Power Devices Characterization Laboratory:
Dr. Xavier Jordà