M. Vellvehi, X. Perpiñà, J. León, O. Aviñó-Salvadó, C. Ferrer and X. Jordà IEEE Transactions on Industrial Electronics The thermal resistance of a High Electron Mobility Transistor (HEMT) forming part of a Monolithic Microwave Integrated Circuit (MMIC) is non-invasively extracted under real working conditions (electrical and thermal) by infrared thermal imaging....
