From August 26th to 29th, Xavier Perpiñà, Ferran Bonet, and Conrad Ferrer from the PDS Group attended the 15th Topical Workshop on Heterostructure Microelectronics (TWHM 2024) held in Sendai, Japan. They presented an invited paper titled "Die-Level Functional Off-Chip Characterization of Power Devices Using Optical Techniques" during the "Power2" session....
Measurement uncertainty in Fourier coefficient-based time series reconstruction considering calibration effects in thermal imaging
Roger Solé, Conrad Ferrer, Oriol Aviñó-Salvadó, Xavier Jordà, Xavier Perpiñà. IEEE Transactions on Instrumentation and Measurement A robust methodology is proposed for determining and assessing measurement uncertainties in thermal imaging systems when the Fourier coefficient-based time-reconstructed method is used. This comprehensive approach addresses factors such as camera-induced noise, setup-related errors,...