Last Tuesday, Xavier Perpiñà from the Institute of Microelectronics of Barcelona (IMB-CNM, CSIC) had the honour of delivering the invited talk that opened the 8th edition of the Electromagnetic Compatibility Conference (EMC), an event hosted by ITA · Instituto Tecnológico de Aragón and, for the first time, jointly organised between Spain and Portugal.

His presentation, titled “Die-Level Electrothermal Characterization of Power Devices for Robustness and EMC Analysis,” highlighted key insights from his research and showcased recent developments within the SAFEPOWER EU Project, with a special focus on the advancements in the Internal InfraRed Laser Deflection (IIR-LD) technique.

As a reminder, Electromagnetic Compatibility (EMC) is essential to ensuring that electronic systems operate safely and without electromagnetic interference.

The conference offered an excellent opportunity to present our latest work and to connect with professionals committed to advancing power electronics, reliability, and EMC.