Emma Solà, a PhD researcher in the Power Devices and Systems (PDS) Group at the Institute of Microelectronics of Barcelona (IMB-CNM, CSIC), completed a research stay at Delft University of Technology (TU Delft, The Netherlands) and Boschman Advanced Packaging Technology (Duiven, The Netherlands). The one-month stay, carried out in May...
Eric Serra Successfully Defends His BSc Thesis
Eric Serra during the public defense of his BSc Thesis at the Escola Politècnica Superior (EPS), University of Girona, on June 23, 2026.On June 23, 2026, Eric Serra successfully defended his Bachelor’s Thesis at the Escola Politècnica Superior (EPS) of the University of Girona (Montilivi Campus, Girona).His thesis, entitled "Development...
PDS participates in the EMERGE Summer School in Modena
Dr. Xavier Jordà (PDS Group, IMB-CNM-CSIC) giving his Technical Lecture on power chip-embedding, with Dr. Alber Filbà (IREC) charing the EMERGE Summer School session.Between 8 and 12 June 2026, the 4th Summer School on Electrical Machines and Drives for Green Transportation Systems (EMERGE) took place. The event was organised by...
Participation in the iMAPS-Iberia Summit 2026 & Microelectronic Workshop
Emma Solà during her oral presentation at iMAPS-Iberia Summit 2026On 11–12 June 2026, the first edition of the iMAPS-Iberia Summit 2026 & Microelectronics Workshop took place in Vilanova i la Geltrú, Barcelona, Spain. The Iberia Chapter of iMAPS (International Microelectronics Packaging and Assembly Society) is a leading non-profit association in...
Multiscale Thermal Modelling of Integrated Motor Drives with PCB-Embedded SiC Power Devices
Mattia Grespan, Sergio Busquets-Monge, Elisabet Mas de les Valls, Salvador Alepuz, Mariana Raya, Xavier Jordà, Davide Barater, Diego Angeli.Applied Thermal Engineering 2026, 131094, vol. 298, Part 3Integrated motor drives are frequently employed in vehicles and aircraft due to their superior power density and efficiency in comparison to separate motors and...
Single-Event Burnout Mitigation in Silicon VDMOS Power Devices: An Electro-Thermal TCAD Study
Eusebio Rodrigo, José Rebollo, Xavier Jordà, José Camps, Llorenç Latorre and Miquel Vellvehi.Electronics 2026, 15, 1201Single-Event Burnout (SEB) is one of the most critical failure mechanisms in silicon powerMOSFETs operating in radiation environments, particularly under heavy-ion irradiation,and often limits device operation through excessive voltage derating. In this work, SEBrobustness of...